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Below are several test plots of the LA 610. Every effort has been made to follow AES standards for each test. These plots show SNR, THD, THD+N, ITU-R and SMPTE intermodulation distortion, and impulse “chirp” based frequency response performance of a stock and a CC&E modified LA 610 measured using the following parameters:
The idea behind tests of this nature is to put the device under difficult conditions in order to get an idea of its performance. It’s like a “how fast can you run that 5K uphill marathon” battery of tests. They show both how well the gain stage does its job as well as the way the output stage performs when driving a load. For a little more in-depth analysis of what we’ve done here, please check out the blog posts written about this procedure.
The first is something known as ITU-R, and the second is SMPTE IMD. Both tests are forms of IMD (intermodulation distortion) tests, and their purpose is to simulate how a device will behave when complex signals (like music) are present. The ITU-R test uses two equal amplitude tones, one at 19kHz and one at 20kHz. The tones influence (modulate) each other to produce distortion products.
This test is performed using a short impulse “chirp” with a frequency spectrum that spans the audible band. Measuring the impulse at LA610′s output with a Fast Fourier Transform (FFT) shows us the device’s frequency response. This test was performed at all five gain settings, -10, -5, 0, +5, and +10, as a means of measuring response at each setting using a -40dB impulse. ”Level” was set to 10 for the test. As we pointed out in our blog post this caused saturation in the stock LA610, resulting in skewed frequency response readings, so the “Level” knob was reduced to 8. This did not prove to be the case for the modified LA 610 though, so we performed the test with the “Level” at 10, as originally intended.